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簡要描述:1 GHz and 500 MHz Probe Bandwidth<1 pF Differential Input Capacitance1 MΩ Differential Input Resistance±42 V (DC + pk AC) Differential Input Voltage>18 dB CMRR (at 250 MHz 50x attenuation)
泰克TDP1000示波器高壓探頭的產(chǎn)品介紹
安全準(zhǔn)確地從“升高”和“浮動(dòng)”電壓系統(tǒng)中捕獲實(shí)時(shí)信號(hào)信息的能力至關(guān)重要。我們的高壓探頭系列可提供您完成單端、差分和隔離測(cè)量所需的安全性。
Features & Benefits
OUTSTANDING ELECTRICAL PERFORMANCE
1 GHz and 500 MHz Probe Bandwidth
<1 pF Differential Input Capacitance
1 MΩ Differential Input Resistance
±42 V (DC + pk AC) Differential Input Voltage
>18 dB CMRR (at 250 MHz 50x attenuation)
Selectable Bandwidth-limiting Filters
DC Reject
VERSATILE DUT CONNECTIVITY
Small Compact Probe Head for Probing Small Geometry Circuit Elements
Straight Pin, Square Pin, Solder Down, Variable Pitch Standard Accessories
Robust Design for Reliability
EASY TO USE
Provides Automatic Units Scaling and Readout on the Oscilloscope Display
TDP1000, TDP0500
Connect Directly to the DPO7000, DPO4000, and MSO4000 Series Oscilloscopes Using TekVPI™ Probe Interface (No additional power adapters required)
Easy Access to Scope-displayed Probe Menu for Probe Setup Control and Operating Status Information
AutoZero – Zeros Out Output Offset
P6251, P6250
Connect Directly to TDS5000 and other TekProbe™ Interface Oscilloscopes, or to TekConnect® Oscilloscopes Using TCA-BNC Adapter
Applications
High-speed Switch Mode Power Supply Design
CAN/LIN Bus Design
High-speed Digital Design
Digital Design and Characterization
Manufacturing Engineering Test
Research and Development
The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today’s Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.
Specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. The TDP1000, TDP0500, P6251, and P6250 High-voltage Differential Probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:
Outstanding Electrical Performance
Versatile Device-Under-Test Connectivity
Ease of Use
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CONTACT
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